135a. Control of Defect Concentrations in Silicon through Surface Chemistry
- Author(s):
- Publication title:
- 2005 annual meeting & fall showcase : '05 AIChE, Oct 30 - Nov 4 : conference proceedings, Cincinnati Convention Center, Cincinnati, OH : non-topical presentation records : 01. Engineering Sciences and Fundamentals
- Title of ser.:
- AIChE Conference Proceedings
- Ser. no.:
- P-221(2)
- Pub. Year:
- 2005
- Pages:
- 1
- Pub. info.:
- New York: American Institute of Chemical Engineers
- ISBN:
- 9780816909964 [0816909962]
- Language:
- English
- Call no.:
- A08000/2005 [CD-ROM]
- Type:
- Conference Proceedings
Similar Items:
|
1
Conference Proceedings
586a. Controlling Ultrashallow Junction Formation through Surface Chemistry
American Institute of Chemical Engineers |
7
Conference Proceedings
(52d) Control of Oxygen Defect Surface Injection in ZnO Via Sub-Monolayer Sulfur Adsorption
American Institute of Chemical Engineers |
|
American Institute of Chemical Engineers |
8
Conference Proceedings
(52d) Control of Oxygen Defect Surface Injection in ZnO Via Sub-Monolayer Sulfur Adsorption
American Institute of Chemical Engineers |
|
3
Conference Proceedings
Defect Engineering by Short-Annealing-Time Methods for Ultrashallow Junction Formation
American Institute of Chemical Engineers |
Electrochemical Society |
|
American Institute of Chemical Engineers |
10
Conference Proceedings
323a. Photostimulation Of Diffusion And Activation Of Dopants In Ion Implantation Applications
American Institute of Chemical Engineers |
|
American Institute of Chemical Engineers |
11
Conference Proceedings
(21g) Control of Point Defect Behavior in Metal Oxides Via Surface Band Bending
American Institute of Chemical Engineers |
|
Materials Research Society |
12
Conference Proceedings
(21g) Control of Point Defect Behavior in Metal Oxides Via Surface Band Bending
American Institute of Chemical Engineers |