Blank Cover Image

Analysis and Reduction of Stacking Faults in Fast Epitaxial Growth

Author(s):
Publication title:
Silicon Carbide and Related Materials 2015 : [ICSCRM 2015] : selected, peer reviewed papers from the 16th International Conference on Silicon Carbide and Related Materials, October 4-9, 2015, Giardini Naxos, Italy
Title of ser.:
Materials science forum
Ser. no.:
858
Pub. Year:
2016
Page(from):
173
Page(to):
176
Pages:
4
Pub. info.:
Aedermannsdorf, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9783035710427 [3035710422]
Language:
English
Call no.:
M23650 [v.858]
Type:
Conference Proceedings

Similar Items:

H. Tsuchida, I. Kamata, M. Ito, T. Miyazawa, H. Uehigashi

Trans Tech Publications

Fujiwara, H., Kimoto, T., Tojo, T., Matsunami, H.

Trans Tech Publications

H. Fujibayashi, M. Ito, H. Ito, I. Kamata, M. Naito

Trans Tech Publications

H. Tsuchida, M. Ito, I. Kamata, M. Nagano, T. Miyazawa

Trans Tech Publications

M. Ito, H. Fujibayashi, H. Ito, I. Kamata, M. Naito

Trans Tech Publications

K. Hara, H. Fujibayashi, Y. Takeuchi, S. Omae

Trans Tech Publications

H. Tsuchida, M. Ito, I. Kamata, M. Nagano

Trans Tech Publications

K. Murase, A. Ito, H. Sugimura

Electrochemical Society

H. Tsuchida, I. Kamata, M. Ito, T. Miyazawa, N. Hoshino

Trans Tech Publications

Ito, K., Nakamoto, T., Inui, H., Yamaguchi, M.

MRS - Materials Research Society

Izumi, S., Tsuchida, H., Tawara, T., Kamata, I., Izumi, K.

Trans Tech Publications

M. Ito, H. Tsuchida, I. Kamata, L. Storasta

Trans Tech Publications

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12