Blank Cover Image

Identification of Stacking Faults by UV Photoluminescence Imaging Spectroscopy on Thick, Lightly-Doped n-Type 4°-off 4H-SiC Epilayers

Author(s):
Publication title:
Silicon Carbide and Related Materials 2014 : Selected peer reviewed papers from the European Conference on Silicon Carbide & Related Materials (ECSCRM 2014), September 21-25, 2014, Grenoble, France
Title of ser.:
Materials science forum
Ser. no.:
821-823
Pub. Year:
2015
Page(from):
323
Page(to):
326
Pages:
4
Pub. info.:
Aedermannsdorf, Switzerland: Trans Tech Publications
ISSN:
02555476
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

Similar Items:

Tsuchida, H., Kamata, I., Jikimoto, T., Izumi, K.

Trans Tech Publications

I. Kamata, X. Zhang, H. Tsuchida

Trans Tech Publications

Tsuchida, H., Kamata, I., Jikimoto, T., Izumi, K.

Trans Tech Publications

X. Zhang, T. Miyazawa, H. Tsuchida

Trans Tech Publications

T. Miyazawa, M. Ito, H. Tsuchida

Trans Tech Publications

T. Yamashita, H. Matsuhata, Y. Miyasaka, M. Odawara, K. Momose

Trans Tech Publications

T. Miyazawa, H. Tsuchida

Trans Tech Publications

M. Nagano, I. Kamata, H. Tsuchida

Trans Tech Publications

K. Nakayama, A. Tanaka, K. Asano, T. Miyazawa, H. Tsuchida

Trans Tech Publications

M. Nagano, I. Kamata, H. Tsuchida

Trans Tech Publications

W.M. Klahold, R.P. Devaty, W.J. Choyke, K. Kawahara, T. Kimoto

Trans Tech Publications

T. Miyazawa, T. Tawara, H. Tsuchida

Trans Tech Publications

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12