Characterisation of YSZ Layers Deposited on Y2O3 Buffered Textured Tapes for Coated Conductors

Characterisation of YSZ Layers Deposited on Y₂O₃ Buffered Textured Tapes for Coated Conductors

Author(s):

Publication title:

Energy, Environment and Functional Materials : Selected, peer reviewed papers from the 12th IUMRS International Conference on Advanced Materials (IUMRS-ICAM 2013), September 22-28, 2013, Qingdao, China

Title of ser.:

Materials science forum

Ser. no.:

787

Pub. Year:

2014

Page(from):

425

Page(to):

430

Pages:

6

Pub. info.:

Aedermannsdorf, Switzerland: Trans Tech Publications

ISSN:

02555476

Language:

English

Call no.:

M23650

Type:

Conference Proceedings

Details

TDL ID:	ZA00054257
Series ID:	PA00000012
Conf. info. (Name):	IUMRS International Conference on Advanced Materials (IUMRS-ICAM 2013)
Conf. info. (Number):	12th
Conf. info. (Venue):	Qingdao, China
Conf. info. (Date):	2013.09.22-2013.09.28
Note for article:	12th IUMRS International Conference on Advanced Materials (IUMRS-ICAM 2013), September 22-28, 2013, Qingdao, China

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