Characteristics of a Schottky Barrier Diode and the SiC Wafers Sliced by Wire Electrical Discharge Machining

Characteristics of a Schottky Barrier Diode and the SiC Wafers Sliced by Wire Electrical Discharge Machining

Author(s):

Publication title:

Silicon carbide and related materials 2013 : selected, peer reviewed papers from the 15th International Conference on Silicon Carbide and Related Materials (ICSCRM 2013), September 29 - October 4, 2013, Miyazaki, Japan

Title of ser.:

Materials science forum

Ser. no.:

778-780

Pub. Year:

2014

Pt.:

2

Page(from):

784

Page(to):

787

Pages:

4

Pub. info.:

Aedermannsdorf, Switzerland: Trans Tech Publications

ISSN:

02555476

Language:

English

Call no.:

M23650

Type:

Conference Proceedings

Details

TDL ID:	ZA00054253
Series ID:	PA00000012
Conf. info. (Name):	International Conference on Silicon Carbide and Related Materials (ICSCRM 2013)
Conf. info. (Number):	15th
Conf. info. (Venue):	Miyazaki, Japan
Conf. info. (Date):	2013.09.29-2013.10.04
Note for article:	15th International Conference on Silicon Carbide and Related Materials (ICSCRM 2013), September 29 - October 4, 2013, Miyazaki, Japan

Similar Items:

1 Conference Proceedings Multi-Wire Electrical Discharge Slicing for Silicon Carbide Part 2: Improvement on Manufacturing Wafers by Forty-Wire EDS A. Itokazu, H. Miyake, T. Hashimoto, K. Fukushima Trans Tech Publications	7 Conference Proceedings Slicing of Rotating SiC Ingot by Electric Discharge Machining N. Yamamoto, S. Yamaguchi, T. Kato Trans Tech Publications
2 Conference Proceedings Multi-Wire Electrical Discharge Slicing for Silicon Carbide A. Itokazu, T. Hashimoto, K. Fukushima, T. Yuzawa, T. Sato Trans Tech Publications	8 Conference Proceedings Characterization of Schottky Diodes on 4H-SiC with Various Off-Axis Angles Grown by Sublimation Epitaxy M. Nakamura, Y. Hashino, T. Furusho, H. Kinoshita, H. Shiomi Trans Tech Publications
3 Conference Proceedings Defect Related Leakage Current Components in SiC Schottky Barrier Diode K. Ohtsuka, T. Nakatani, A. Nagae, H. Watanabe, Y. Nakaki Trans Tech Publications	9 Conference Proceedings Ion-Induced Anomalous Charge Collection Mechanisms in SiC Schottky Barrier Diodes T. Makino, M. Deki, S. Onoda, N. Hoshino, H. Tsuchida Trans Tech Publications
4 Conference Proceedings Electrical Characteristics of Ti/4H-SiC Slicidation Schottky Barrier Diode A. Kinoshita, T. Nishi, T. Ohyanagi, T. Yatsuo, K. Fukuda Trans Tech Publications	10 Conference Proceedings Reverse Characteristics of a 4H-SiC Schottky Barrier Diode Hatakeyama, T., Shinohe, T. Trans Tech Publications
5 Conference Proceedings Comparison of Electrical Characteristics of 4H-SiC(0001) and (000-1) Schottky Barrier Diodes Nakamura, T., Miyanagi, T., Kamata, I., Tsuchida, H. Trans Tech Publications	11 Conference Proceedings Reverse Characteristics of a 4H-SiC Schottky Barrier Diode Hatakeyama, T., Shinohe, T. Trans Tech Publications
6 Conference Proceedings Improvement of I-V Characteristics of Schottky Barrier Diode by 4H-SiC Surface Planarization H. Fujiwara, A. Onogi, T. Katsuno, T. Morino, T. Endo Trans Tech Publications	12 Conference Proceedings Fabrication of 4H-SiC Floating Junction Schottky Barrier Diodes (Super-SBDs) and their Electrical Properties Ota, C., Nishio, J., Hatakeyama, T., Shinohe, T., Kojima, K., Nishizawa, S., Ohashi, H. Trans Tech Publications

1

2

3

4

5

6

7

8

9

10

11

12