Blank Cover Image

Radiation-Induced Trapped Charging Effects in SiC Power MOSFETs

Author(s):
Publication title:
Silicon carbide and related materials 2013 : selected, peer reviewed papers from the 15th International Conference on Silicon Carbide and Related Materials (ICSCRM 2013), September 29 - October 4, 2013, Miyazaki, Japan
Title of ser.:
Materials science forum
Ser. no.:
778-780
Pub. date:
2014
Pt.:
1
Page(from):
533
Page(to):
536
Pages:
4
Pub. info.:
Aedermannsdorf, Switzerland: Trans Tech Publications
ISSN:
02555476
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

Similar Items:

R. Green, A.J. Lelis, D.B. Habersat

Trans Tech Publications

R. Green, A.J. Lelis, M. El, D.B. Habersat

Trans Tech Publications

R. Green, D.P. Urciuoli, A.J. Lelis

Trans Tech Publications

D.B. Habersat, A.J. Lelis, R. Green

Trans Tech Publications

A.J. Lelis, D.B. Habersat, R. Green, N. Goldsman

Trans Tech Publications

S. Potbhare, N. Goldsman, G. Pennington, A. Lelis, J.M. McGarrity

Trans Tech Publications

R. Green, A. Lelis, M. El, D. Habersat

Trans Tech Publications

D.B. Habersat, A.J. Lelis, R. Green, M. El

Trans Tech Publications

A.J. Lelis, R. Green, D.B. Habersat

Trans Tech Publications

Lelis, A.J., Habersat, D.B., Lopez, G., McGarrity, J.M., McLean, F.B., Goldsman, N.

Trans Tech Publications

A.J. Lelis, R. Green, D.B. Habersat

Trans Tech Publications

D.B. Habersat, A.J. Lelis, R. Green, M. El

Trans Tech Publications

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12