Blank Cover Image

Three-Dimensional Imaging of Extended Defects in 4H-SiC by Optical Second-Harmonic Generation

Author(s):
Publication title:
Silicon carbide and related materials 2013 : selected, peer reviewed papers from the 15th International Conference on Silicon Carbide and Related Materials (ICSCRM 2013), September 29 - October 4, 2013, Miyazaki, Japan
Title of ser.:
Materials science forum
Ser. no.:
778-780
Pub. Year:
2014
Pt.:
1
Page(from):
338
Page(to):
341
Pages:
4
Pub. info.:
Aedermannsdorf, Switzerland: Trans Tech Publications
ISSN:
02555476
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

Similar Items:

R. Tanuma, H. Tsuchida

Trans Tech Publications

Stolen R. H.

Plenum Press

R. Tanuma, M. Nagano, I. Kamata, H. Tsuchida

Trans Tech Publications

I. Kamata, X. Zhang, H. Tsuchida

Trans Tech Publications

R. Tanuma, D. Mori, I. Kamata, H. Tsuchida

Trans Tech Publications

R. Tanuma, T. Tamori, Y. Yonezawa, H. Yamaguchi, H. Matsuhata

Trans Tech Publications

R. Tanuma, D. Mori, I. Kamata, H. Tsuchida

Trans Tech Publications

Chen, Zhongping, Lewis, A., Kumar, J., Tripathy, S., Marx, K., Akkara, J., Kaplan, D.

MRS - Materials Research Society

M.-H. Chen, W.-L. Chen, Y. Sun, P. T. Fwu, M.-G. Lin, C.-Y. Dong

SPIE - The International Society of Optical Engineering

M. Nagano, H. Tsuchida, T. Suzuki, T. Hatakeyama, J. Senzaki

Trans Tech Publications

M. Nagano, H. Tsuchida, T. Suzuki, T. Hatakeyama, J. Senzaki

Trans Tech Publications

Both, M., Vogel, M., Fink, R.H.A., Uttenweiler, D.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12