Microscopic Degradation Analysis of RF-Stressed AlGaN/GaN HEMTs
- Author(s):
- Publication title:
- Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011, Miyazaki, Japan
- Title of ser.:
- Materials science forum
- Ser. no.:
- 725
- Pub. Year:
- 2012
- Page(from):
- 79
- Page(to):
- 82
- Pages:
- 4
- Pub. info.:
- Aedermannsdorf, Switzerland: Trans Tech Publications
- ISSN:
- 02555476
- Language:
- English
- Call no.:
- M23650
- Type:
- Conference Proceedings
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