Blank Cover Image

Defect Related Leakage Current Components in SiC Schottky Barrier Diode

Author(s):
Publication title:
Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011, Miyazaki, Japan
Title of ser.:
Materials science forum
Ser. no.:
725
Pub. date:
2012
Page(from):
53
Page(to):
56
Pages:
4
Pub. info.:
Aedermannsdorf, Switzerland: Trans Tech Publications
ISSN:
02555476
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

Similar Items:

T. Ishikawa, T. Katsuno, Y. Watanabe, H. Fujiwara, T. Endo

Trans Tech Publications

Hatakeyama, T., Kushibe, M., Watanabe, T., Imai, S., Shinohe, T.

Trans Tech Publications

T. Katsuno, Y. Watanabe, T. Ishikawa, H. Fujiwara, M. Konishi

Trans Tech Publications

K. Ohtsuka, Y. Tarui, T. Watanabe, K. Fujihira, Y. Matsuno

Trans Tech Publications

Saitoh, H., Kimoto, T., Matsunami, H.

Trans Tech Publications

H. Miyake, N. Tomita, Y. Nakaki, T. Furusho, A. Itokazu

Trans Tech Publications

J. Hasegawa, K. Konishi, Y. Nakamura, K. Ohtsuka, S. Nakata

Trans Tech Publications

Izumi, S., Fujisawa, H., Tawara, T., Ueno, K., Hiraoka, M.

Trans Tech Publications

Tsuji, T., Izumi, S., Ueda, A., Fujisawa, H., Ueno, K., Tsuchida, H., Kamata, I., Jikimoto, T., Izumi, K.

Trans Tech Publications

Ohtsuka, K., Sugimoto, H., Kinouchi, S.I., Tarui, Y., Imaizumi, M., Takami, T., Ozeki, T.

Trans Tech Publications

Tsuji, T., Izumi, S., Ueda, A., Fujisawa, H., Ueno, K., Tsuchida, H., Kamata, I., Jikimoto, T., Izumi, K.

Trans Tech Publications

Ohtsuka, K., Sugimoto, H., Kinouchi, S., Tarui, Y., Imaizumi, M., Takami, T., Ozeki, T.

Trans Tech Publications

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12