Blank Cover Image

A Theoretical and Experimental Comparison of 4H- and 6H-SiC MSM UV Photodetectors

Author(s):
Publication title:
Silicon carbide and related materials 2011 : selected, peer reviewed papers from the 14th International Conference on Silicon Carbide and Related Materials 2011 (ICSCRM 2011), September 11-16, 2011, Cleveland, Ohio, USA
Title of ser.:
Materials science forum
Ser. no.:
717-720
Pub. Year:
2012
Pt.:
2
Page(from):
1207
Page(to):
1210
Pages:
4
Pub. info.:
Aedermannsdorf, Switzerland: Trans Tech Publications
ISSN:
02555476
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Temperature-Dependent Characteristics of 4H-SiC Buried Grid JBS Diodes

J.K. Lim, S.A. Reshanov, W. Kaplan, A. Zhang, T. Hjort

Trans Tech Publications
7 Conference Proceedings GaN-Based MSM uv Photodetectors

Liang, S., Cai, W., Li, Y., Liu, Y., Lu, Y., Tran, C. A., Karlicek, R. F., Jr., Ferguson, I.

MRS - Materials Research Society
2 Conference Proceedings Design Optimization of a High Temperature 1.2 kV 4H-SiC Buried Grid JBS Rectifier

H. Elahipanah, N. Thierry-Jebali, S.A. Reshanov, W. Kaplan, A. Zhang, J.K. Lim, M. Bakowski, M. Östling, A. Schöner

Trans Tech Publications
8 Conference Proceedings Comparison of Electrically and Optically Determined Minority Carrier Lifetimes in 6H-SiC

Reshanov, S. A., Pensl, G.

Trans Tech Publications
3 Conference Proceedings Midgap Defects in 4H-, 6H- and 3C-SiC Detected by Deep Level Optical Spectroscopy

Reshanov, S.A., Schneider, K., Helbig, R., Pensl, G., Nagasawa, H., Schoner, A.

Trans Tech Publications
9 Conference Proceedings Lifetime Investigations of 4H-SiC PiN Power Diodes

S.A. Reshanov, W. Bartsch, B. Zippelius, G. Pensl

Trans Tech Publications
4 Conference Proceedings Effect of Neutron Irradiation on Epitaxial 4H-SiC PiN UV-Photodiodes

A.V. Afanasyev, V.A. Ilyin, V.V. Luchinin, S.A. Reshanov, A. Schöner, K.A. Sergushichev, A.A. Smirnov

Trans Tech Publications
10 Conference Proceedings Theoretical Studies of Vanadium Impurity in β-SiC

Tairov, Y.M., Reshanov, S.A., Parfenova, I.I., Yuryeva, E.I., Ivanovskii, A.L.

Trans Tech Publications
5 Conference Proceedings Planarization of Epitaxial SiC Trench Structures by Plasma Ion Etching

A.Z. Zhang, S.A. Reshanov, A. Schöner, W. Kaplan, N. Kwietniewski

Trans Tech Publications
11 Conference Proceedings Theoretical Studies of Vanadium Impurity in β-SiC

Tairov, Y.M., Reshanov, S.A., Parfenova, I.I., Yuryeva, E.I., Ivanovskii, A.L.

Trans Tech Publications
6 Conference Proceedings Electrical Characterization of Erbium-Implanted 4H-SiC Epilayers

Reshanov, S.A., Klettke, O., Pensl, G., Choyke, W.J.

Trans Tech Publications
12 Conference Proceedings EPR Study of Electron Irradiation-Induced Defects in Semi-Insulating SiC:V

von Bardeleben, H.J., Cantin, J.L., Reshanov, S.A., Rastegaev, V.P.

Trans Tech Publications
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12