Blank Cover Image

Improved Deposited Oxide Interfaces from N2 Conditioning of Bare SiC Surfaces

Author(s):
Publication title:
Silicon carbide and related materials 2011 : selected, peer reviewed papers from the 14th International Conference on Silicon Carbide and Related Materials 2011 (ICSCRM 2011), September 11-16, 2011, Cleveland, Ohio, USA
Title of ser.:
Materials science forum
Ser. no.:
717-720
Pub. Year:
2012
Pt.:
2
Page(from):
729
Page(to):
732
Pages:
4
Pub. info.:
Aedermannsdorf, Switzerland: Trans Tech Publications
ISSN:
02555476
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

Similar Items:

T. Ohnuma, A. Miyashita, M. Yoshikawa, H. Tsuchida

Trans Tech Publications

M. Nagano, I. Kamata, H. Tsuchida

Trans Tech Publications

M. Nagano, H. Tsuchida, T. Suzuki, T. Hatakeyama, J. Senzaki

Trans Tech Publications

M. Nagano, I. Kamata, H. Tsuchida

Trans Tech Publications

T. Ohnuma, A. Miyashita, M. Iwasawa, M. Yoshikawa, H. Tsuchida

Trans Tech Publications

T. Ohnuma, A. Miyashita, M. Iwasawa, M. Yoshikawa, H. Tsuchida

Trans Tech Publications

M. Nagano, H. Tsuchida, T. Suzuki, T. Hatakeyama, J. Senzaki

Trans Tech Publications

M. Cabello, V. Soler, N. Mestres, J. Montserrat, J. Rebollo, J. Millán, P. Godignon

Trans Tech Publications

M. Nagano, H. Tsuchida, T. Suzuki, T. Hatakeyama, J. Senzaki

Trans Tech Publications

H. Tsuchida, I. Kamata, M. Nagano

Trans Tech Publications

H. Tsuchida, M. Ito, I. Kamata, M. Nagano

Trans Tech Publications

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12