Long Carrier Lifetimes in n-Type 4H-SiC Epilayers
- Author(s):
- P.B. Klein
- Publication title:
- Silicon carbide and related materials 2011 : selected, peer reviewed papers from the 14th International Conference on Silicon Carbide and Related Materials 2011 (ICSCRM 2011), September 11-16, 2011, Cleveland, Ohio, USA
- Title of ser.:
- Materials science forum
- Ser. no.:
- 717-720
- Pub. Year:
- 2012
- Pt.:
- 1
- Page(from):
- 279
- Page(to):
- 284
- Pages:
- 6
- Pub. info.:
- Aedermannsdorf, Switzerland: Trans Tech Publications
- ISSN:
- 02555476
- Language:
- English
- Call no.:
- M23650
- Type:
- Conference Proceedings
Similar Items:
Trans Tech Publications |
7
Conference Proceedings
Modelling of Effective Minority Carrier Lifetime in 4H-SiC n-Type Epilayers
Trans Tech Publications |
Electrochemical Society |
8
Conference Proceedings
Identification of Defects Limiting the Carrier Lifetime in n-Epitaxial Layers of 4H-SiC
Trans Tech Publications |
Trans Tech Publications |
9
Conference Proceedings
Depth-Resolved Carrier Lifetime Measurements in 4H-SiC Epilayers Monitoring Carbon Vacancy Elimination
Trans Tech Publications |
Trans Tech Publications |
Trans Tech Publications |
Trans Tech Publications |
11
Conference Proceedings
CL/EBIC-SEM Techniques for Evaluation of Impact of Crystallographic Defects on Carrier Lifetime in 4H-SiC Epitaxial Layers
Trans Tech Publications |
Trans Tech Publications |
Trans Tech Publications |