Blank Cover Image

Calculation Methods to Determine Crystallographic Elements Based on Electron Diffraction Orientation Measurements by SEM/EBSD or TEM

Author(s):
Publication title:
THERMEC 2011 : International Conference on Processing & Manufacturing of Advanced Materials : processing, fabrication, properties, applications, August 1-5, 2011, Quebec City, Canada
Title of ser.:
Materials science forum
Ser. no.:
706-709
Pub. Year:
2012
Pt.:
4
Page(from):
2674
Page(to):
2679
Pages:
6
Pub. info.:
Aedermannsdorf, Switzerland: Trans Tech Publications
ISSN:
02555476
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

Similar Items:

L. Zuo, Z.B. Li, Y.D. Zhang, C. Esling, X. Zhao

Trans Tech Publications

Z.B. Li, Y.D. Zhang, C. Esling, H. Yang, J.J. Wang

Trans Tech Publications

Z.B. Li, Y.D. Zhang, C. Esling, X. Zhao, L. Zuo

Trans Tech Publications

H.L. Yan, Y.D. Zhang, Z.B. Li, C. Esling, X. Zhao

Trans Tech Publications

Y.D. Zhang, S.Y. Wang, C. Esling, X. Zhao, L. Zuo

Trans Tech Publications

Z.B. Li, B. Yang, Y.D. Zhang, C. Esling, X. Zhao

Trans Tech Publications

Y.D. Zhang, C. Esling, X. Zhao, L. Zuo

Trans Tech Publications

Z.B. Li, B. Yang, Y.D. Zhang, C. Esling, X. Zhao, L. Zuo

Trans Tech Publications

Y.D. Zhang, C. Esling, X. Zhao, L. Zuo

Trans Tech Publications

H.L. Yan, Y.D. Zhang, Z.B. Li, C. Esling, X. Zhao, L. Zuo

Trans Tech Publications

H.L. Yan, Y.D. Zhang, B. Yang, C. Esling, X. Zhao, L. Zuo

Trans Tech Publications

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12