Thin Film Stress and Texture Analysis at the MCX Synchrotron Radiation Beamline at ELETTRA

Thin Film Stress and Texture Analysis at the MCX Synchrotron Radiation Beamline at ELETTRA

Author(s):

Publication title:

Residual stresses VIII : selected, peer reviewed papers from the 8th European Conference on Residual Stresses, ECRS8, 2010, June 26-28, 2010, Riva del Garda, Italy

Title of ser.:

Materials science forum

Ser. no.:

681

Pub. Year:

2011

Page(from):

115

Page(to):

120

Pages:

6

Pub. info.:

Aedermannsdorf, Switzerland: Trans Tech Publications

ISSN:

02555476

Language:

English

Call no.:

M23650

Type:

Conference Proceedings

Details

TDL ID:	ZA00054178
Series ID:	PA00000012
Conf. info. (Name):	European Conference on Residual Stresses, ECRS8
Conf. info. (Number):	8th
Conf. info. (Venue):	Riva del Garda, Italy
Conf. info. (Date):	2010.06.26-2010.06.28
Note for article:	8th European Conference on Residual Stresses, ECRS8, 2010, June 26-28, 2010, Riva del Garda, Italy

Similar Items:

1 Conference Proceedings Sub-Surface Residual Stress Gradients: Advances in Laboratory XRD Methods Azanza Ricardo, C.L., D'Incau, M., Scardi, P. Trans Tech Publications	7 Conference Proceedings WPPM: Microstructural Analysis beyond the Rietveld Method P. Scardi, M. Ortolani, M. Leoni Trans Tech Publications
2 Conference Proceedings Influence of Shot-Peening Parameters on the Sub-Surface Residual Stress Profiles in Al-7075 Alloy Components D. Cecchin, C.L. Azanza Ricardo, M. D'Incau, M. Bandini, P. Scardi Trans Tech Publications	8 Conference Proceedings Capillary concentrators for synchrotron radiation beamlines Heald,S.M., Brewe,D.L., Kim,K.H., Brown,F.C., Barg,B., Stern,E.A. SPIE-The International Society for Optical Engineering
3 Conference Proceedings Residual Stress Depth-Profiling in Shot-Peened Al Alloy Components Subjected to Fatigue Testing C.L. Azanza Ricardo, G. Degan, M. Bandini, P. Scardi Trans Tech Publications	9 Conference Proceedings Strain-Texture Correlation in r. f. Magnetron Sputtered Thin Films Leoni, M., Dong, Y. H., Scardi, P. Trans Tech Publications
4 Conference Proceedings Monchromator for the synchrotron radiation beamline X-MOSS at ELETTRA Naletto,G., Pelizzo,M.-G., Tondello,G., Nannarone,S., Giglia,A. SPIE-The International Society for Optical Engineering	10 Conference Proceedings Residual Stresses in Polycrystalline Thin Films Scardi, P., Dong, Yu Hui Trans Tech Publications
5 Conference Proceedings Residual Stress in Diamond Coatings by Synchrotron Radiation XRD Scardi,P., Leoni,M., Sessa,V., Terranova,M.L., Cappuccio,G. Trans Tech Publications	11 Conference Proceedings A Computer Program for Structural Refmement from Thin Film XRD Patterns Leoni,M., Scardi,P. Trans Tech Publications
6 Conference Proceedings Microstructure and Phase Morphology of Diamond Thin Films by Synchrotron Radiation X-Ray Diffraction Cappuccio,G., Leoni,M., Scardi,P., Sessa,V., Terranova,M.L. Trans Tech Publications	12 Conference Proceedings Aberration analysis calculations for synchrotron radiation beamline design McKinney,W.R., Howells,M.R., Padmore,H.A. SPIE-The International Society for Optical Engineering

1

2

3

4

5

6

7

8

9

10

11

12