Blank Cover Image

Effects of Thermal Oxidation on Deep Levels Generated by Ion Implantation into n-Type and p-Type 4H-SiC

Author(s):
Publication title:
Silicon carbide and related materials 2009 : selected peer reviewed papers from the International Conference on Silicon Carbide and Related Materials 2009, Nurnberg, Germany, October 11-16, 2009
Title of ser.:
Materials science forum
Ser. no.:
645-648
Pub. Year:
2010
Pt.:
2
Page(from):
651
Page(to):
654
Pages:
4
Pub. info.:
Aedermannsdorf, Switzerland: Trans Tech Publications
ISSN:
02555476
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

Similar Items:

K. Kawahara, G. Alfieri, T. Kimoto

Trans Tech Publications

K. Kawahara, J. Suda, T. Kimoto

Trans Tech Publications

K. Kawahara, G. Alfieri, M. Krieger, T. Kimoto

Trans Tech Publications

G. Alfieri, T. Kimoto

Trans Tech Publications

G. Alfieri, T. Kimoto

Trans Tech Publications

T. Kimoto, G. Feng, T. Hiyoshi, K. Kawahara, M. Noborio

Trans Tech Publications

G. Alfieri, T. Kimoto, G. Pensl

Trans Tech Publications

G. Alfieri, T. Kimoto

Trans Tech Publications

G. Alfieri, T. Kimoto

Trans Tech Publications

K. Danno, T. Kimoto

Trans Tech Publications

K. Kawahara, H. Watanabe, N. Miura, S. Nakata, S. Yamakawa

Trans Tech Publications

S.A. Reshanov, G. Pensl, K. Danno, T. Kimoto, S. Hishiki

Trans Tech Publications

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12