Blank Cover Image

Stacking Faults around the Hetero-Interface Induced by 6H-SiC Polytype Transformation on 3C-SiC with Solution Growth

Author(s):
Publication title:
Silicon carbide and related materials 2009 : selected peer reviewed papers from the International Conference on Silicon Carbide and Related Materials 2009, Nurnberg, Germany, October 11-16, 2009
Title of ser.:
Materials science forum
Ser. no.:
645-648
Pub. Year:
2010
Pt.:
1
Page(from):
363
Page(to):
366
Pages:
4
Pub. info.:
Aedermannsdorf, Switzerland: Trans Tech Publications
ISSN:
02555476
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

Similar Items:

K. Seki, R. Tanaka, T. Ujihara, Y. Takeda

Trans Tech Publications

K. Murayama, T. Hori, S. Harada, S. Xiao, M. Tagawa, T. Ujihara

Trans Tech Publications

K. Seki, S. Kozawa, Y. Yamamoto, T. Ujihara, Y. Takeda

Trans Tech Publications

S. Harada, Y. Yamamoto, K. Seki, T. Ujihara

Trans Tech Publications

Y. Yamamoto, K. Seki, S. Kozawa, S. Harada, T. Ujihara

Trans Tech Publications

T. Ujihara, S. Kozawa, K. Seki, Y. Yamamoto, S. Harada

Trans Tech Publications

K. Seki, S. Harada, T. Ujihara

Trans Tech Publications

R. Tanaka, K. Seki, S. Komiyama, T. Ujihara, Y. Takeda

Trans Tech Publications

R. Tanaka, K. Seki, T. Ujihara, Y. Takeda

Trans Tech Publications

K. Shibata, S. Harada, T. Ujihara

Trans Tech Publications

T. Ujihara, R. Maekawa, R. Tanaka, K. Sasaki, K. Kuroda

Trans Tech Publications

Kamei, K., Kusunoki, K., Munetoh, S., Ujihara, T., Nakajima, K.

Trans Tech Publications

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12