Effect of Source and Drain Contacts Schottky Barrier on 3C-SiC Nanowire FETs I-V Characteristics

Effect of Source and Drain Contacts Schottky Barrier on 3C-SiC Nanowire FETs I-V Characteristics

Author(s):

Publication title:

Silicon carbide and related materials 2008 : selected peer reviewed papers from the 7th European Conference on Silicon Carbide and Related Materials, September 7-11 Barcelona, Spain

Title of ser.:

Materials science forum

Ser. no.:

615-617

Pub. Year:

2009

Page(from):

235

Page(to):

238

Pages:

4

Pub. info.:

Aedermannsdorf, Switzerland: Trans Tech Publications

ISSN:

02555476

Language:

English

Call no.:

M23650

Type:

Conference Proceedings

Details

TDL ID:	ZA00054140
Series ID:	PA00000012
Conf. info. (Name):	European Conference on Silicon Carbide and Related Materials
Conf. info. (Number):	7th
Conf. info. (Venue):	Barcelona, Spain
Conf. info. (Date):	2008.09.07-2008.09.11
Note for article:	7th European Conference on Silicon Carbide and Related Materials, September 7-11 Barcelona, Spain

Similar Items:

1 Conference Proceedings Schottky Barrier 3C-SiC Nanowire Field Effect Transistor K. Rogdakis, E. Bano, L. Montes, M. Bechelany, D. Cornu Trans Tech Publications	7 Conference Proceedings A Manipulation of Semiconducting GaN Nanowires by Dielectrophoresis Aligned Assembly Deposition (DAAD) S.Y. Lee, T.H. Kim, D.I. Suh, J.E. Park, E.K. Suh, C.H. Hong, S.K. Lee Trans Tech Publications
2 Conference Proceedings Theoretical Comparison of 3C-SiC and Si Nanowire FETs in Ballistic Regime K. Rogdakis, M. Bescond, E. Bano, K. Zekentes Trans Tech Publications	8 Conference Proceedings Material Limitations for the Development of High Performance SiC NWFETs K. Zekentes, K. Rogdakis, E. Bano Trans Tech Publications
3 Conference Proceedings Field Effect Transistors Based on Catalyst-Free Grown 3C-SiC Nanowires K. Rogdakis, E. Bano, L. Montes, M. Bechelany, D. Cornu Trans Tech Publications	9 Conference Proceedings Study of Ni-Silicide Contacts to Si:C Source/Drain. S. Mertens, Y. Cho, F. Nouri, R. Schreutelkamp, Y. Kim, P. Verheyen, J. Steenbergen, C. Vrancken, H. Bender, O. Richard, … Electrochemical Society
4 Conference Proceedings Improvements in the Reverse Characteristics of 4H-SiC Schottky Barrier Diodes by Hydrogen Treatments Kim, D.H., Na, H.J., Jung, S.Y., Song, I.B., Um, M.Y., Song, H.K., Jeong, J.K., Lee, J.B., Kim, H.J. Trans Tech Publications	10 Conference Proceedings Annealing effects of schottky contacts on the characteristics of 4H-SiC schottky barrier diodes Kang, S. C., Kum, B. H., Do, S. J., Je, J. H., Shin, M. W. MRS-Materials Research Society
5 Conference Proceedings Direct Electrical Characteristics of GaN Nanowire Field Effect Transistor (FET) without Assistance of E-Beam Lithography (EBL) Lee, S.K., Seong, H.K., Choi, K.C., Cho, N.K., Choi, H.J., Suh, E.K., Nahm, K.S. Trans Tech Publications	11 Conference Proceedings Effects of Interfacial Reactions on Electrical Properties of Ni Ohmic Contacts on n-Type 4H-SiC Han, S.Y., Kim, N.-K., Kim, E.-D., Lee, J.-L. Trans Tech Publications
6 Conference Proceedings Fabrication and Electrical Transport Properties of CVD Grown Silicon Carbide Nanowires (SiC NWs) for Field Effect Transistor Seong, H.K., Lee, S.Y., Choi, H.J., Kim, T.H., Cho, N.K., Nahm, K.S., Lee, S.K. Trans Tech Publications	12 Conference Proceedings Miniaturized microstrip multipole low-pass filters using high-temperature superconducting YBa₂Cu₃O_7-x thin films J. Kim, K.-Y. Kang, S.K. Han, S.Y. Lee, D. Ahn Society of Photo-optical Instrumentation Engineers

1

2

3

4

5

6

7

8

9

10

11

12