Reduction in Gate Leakage Current of AlGaN/GaN HEMT by Rapid Thermal Oxidation
- Author(s):
- Publication title:
- Compound semiconductor materials and devices : symposium held December 1-6, 2013, Boston, Massachusetts, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 1635
- Pub. Year:
- 2014
- Page(from):
- 3
- Page(to):
- 8
- Pages:
- 6
- Pub. info.:
- Warrendale, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781605116129 [1605116122]
- Language:
- English
- Call no.:
- M23500/1635
- Type:
- Conference Proceedings
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