Blank Cover Image

Linearity Analysis in Double Gate Graded-Channel Soi Devices Applied to 2-Mos Mosfet-C Balanced Structures

Author(s):
Publication title:
Microelectonics Technology and Devices - SBMicro 2008
Title of ser.:
ECS transactions
Ser. no.:
14(1)
Pub. Year:
2008
Page(from):
273
Page(to):
282
Pages:
10
Pub. info.:
Pennington, N.J.: Electrochemical Society
ISSN:
19385862
ISBN:
9781566776462 [1566776465]
Language:
English
Call no.:
E23400/14-1
Type:
Conference Proceedings

Similar Items:

R. T. Doria, M. A. Pavanello, A. Cerdeira, J. Raskin, D. Flandre

Electrochemical Society

M. de Souza, D. Flandre, M. A. Pavanello

Electrochemical Society

Rodrigo Doria, Marcelo Pavanello, Antonio Cerdeira, Jean-Pierre Raskin, Denis Flandre

Electrochemical Society

Pavanello, M. A., Cerdeira, A., Martino, J. A., Alernan, M. A., Flandre, D.

Electrochemical Society

Pavanello, M. A., Cerdeira, A., Martino, J. A., Aleman, M. A., Flandre, D.

Electrochemical Society

F.A. Ferreira, A. Cerdeira, M.A. Pavanello

Electrochemical Society

dos Santos, C. D. G., Pavanello, M. A., Martino, J. A., Flandre, D., Raskin, J.-P.

Electrochemical Society

Pavanello, M.A., Ifiiguez, B., Martino, J.A., Flandre, D.

Electrochemical Society

Pavanello, M.A., Martino, J.A., Chung, T.M., Kranti, A., Raskin, J.-P., Flandre, D.

Electrochemical Society

Kiichytska, V., Chung, T.M., van Meer, H., de Meyer, K., Raskin, J.P., Flandre, D.

Electrochemical Society

M. A. Pavanello, J. A. Martino, T. M. Chung, A. Kranti, J.-P. Raskin, D. Flandre

Electrochemical Society

A. A. Santos, D. Flandre, M. A. Pavanello

Electrochemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12