Blank Cover Image

Error Analysis of Ray's Light Path for Axis-Symmetrical Optical System by Using Skew Ray Tracing

Author(s):
Publication title:
Innovation for applied science and technology : selected, peer reviewed papers from the Second International Conference on Engineering and Technology Innovation 2012, November 2-6, 2012, Kaohsiung, Taiwan, R. O. C.
Title of ser.:
Applied mechanics and materials
Ser. no.:
284-287
Pub. Year:
2013
Vol.:
4
Page(from):
2741
Page(to):
2745
Pages:
5
Pub. info.:
Stafa-Zuerich: Trans Tech Publications
ISSN:
16609336
ISBN:
9781627480550 [1627480552]
Language:
English
Call no.:
A69500/284
Type:
Conference Proceedings

Similar Items:

Sung, C.K., Lin, P.D.

Trans Tech Publications

Lin, C.-., Lai, R., Huang, W.H., Wang, B.C., Chen, C.Y., Kung, C.H., Yoo, C.-S., Chen, J.-J., Lee, S.-C.

SPIE-The International Society for Optical Engineering

Wang, Chun Chieh, Kang, Yuan, Liao, Chin Chi

Trans Tech Publications

Ta-Chuan Liao, Chun-Yu Wu, Feng-Tso Chien, Chun-Chien Tsai, Hsiu-Hsin Chen, Chung-Yuan Kung, Huang-Chung Cheng

Materials Research Society

Cheng-Ming Chuang, Chun-Yan Chen, Hong-Tzong Yau

American Society of Mechanical Engineers

Wang, Chao-Chun, Lin, Chiao-Ju, Chen, Mao-Chieh

Materials Research Society

Chen, Chun Ta, Chen, Shin Yong, Liao, Chien Hsiang, Zeng, Shi Chang

Trans Tech Publications

Bathel,R., Sinzinger,S., Jahns,J.

SPIE - The International Society for Optical Engineering

Kung, Chien Chun, Chen, Kuei Yi

Trans Tech Publications

Chun-Chieh Wang, Cheng-Kuo Sung, Paul C. P. Chao

American Society of Mechanical Engineers

Juuso,S., Liang,C., Makinen,J.-T., Rantala,J.T., Descour,M.R.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12