Hole Mobility in Si(110) p-MOS Transistors

Hole Mobility in Si(110) p-MOS Transistors

Author(s):

Publication title:

Solid State (General) - 214th ECS Meeting/PRiME 2008

Title of ser.:

ECS transactions

Ser. no.:

16(40)

Pub. Year:

2009

Page(from):

7

Page(to):

12

Pages:

6

Pub. info.:

Pennington, NJ: Electrochemical Society

ISSN:

19385862

ISBN:

9781615673124 [1615673121]

Language:

English

Call no.:

E23400/16-36 [40]

Type:

Conference Proceedings

Details

TDL ID:	ZA00049535
Series ID:	PA00000034
Conf. info. (Name):	Meeting of the Electrochemical Society
Conf. info. (Number):	214th
Conf. info. (Venue):	Honoulu, Hawaii, USA
Conf. info. (Date):	2008.10.12-2008.10.17
Note for article:	214th ECS Meeting, October 12-17, 2008, Honolulu, Hawaii, USA

Similar Items:

1 Conference Proceedings Impact of Improved Mobilities and Suppressed 1/f Noise in Fully Depleted SOI MOSFETs Fabricated on Si(110) Surface W. Cheng, A. Teramoto, C. Tye, P. Gaubert, M. Hirayama, S. Sugawa, T. Ohmi Electrochemical Society	7 Conference Proceedings THE EFFECT OF OXYGEN CONCENTRATION IN CLEANING PROCESS ON SILICON SURFACE N. Mizutani, H. Morinaga, A. Teramoto, T. Ohmi Electrochemical Society
2 Conference Proceedings NBTI Mechanism Based on Hole-Injection for Accurate Lifetime Prediction A. Teramoto, R. Kuroda, T. Ohmi Electrochemical Society	8 Conference Proceedings SUPRESSION OF SURFACE MICRO-ROUGHNESS OF SILICON WAFER BY ADDITION OF ALCOHOL INTO ULTRA PURE WATER FOR RINSING PROCESS M. Yamamoto, K. Nii, H. Morinaga, A. Teramoto, T. Ohmi Electrochemical Society
3 Conference Proceedings Suppression of Surface Micro-Roughness on Si(110) Nii, K., Akahori, H., Yamamoto, M., Teramoto, A., Ohmi, T. Electrochemical Society	9 Conference Proceedings New NBTI Lifetime Prediction Method for Ultra Thin SiO₂ Film K. Watanabe, R. Kuroda, A. Teramoto, S. Sugawa, T. Ohmi Electrochemical Society
4 Conference Proceedings Interface States and Field-Effect Mobility in 6H-SiC MOS Transistors Arnold,E., Ramungul,N., Chow,T.P., Ghezzo,M. Trans Tech Publications	10 Conference Proceedings Hot Carrier Instability Mechanism in Accumulation-Mode Normally-off SOI nMOSFETs and Their Reliability Advantage R. Kuroda, A. Teramoto, W. Cheng, S. Sugawa, T. Ohmi Electrochemical Society
5 Conference Proceedings Performance Boost Using a New Device Structure Design for SOI MOSFETs Beyond 25nm Node W. Cheng, A. Teramoto, T. Ohmi Electrochemical Society	11 Conference Proceedings High Reliability of Ultraclean Oxide Films M. Morita, K. Nakamura, A. Teramoto, K. Makihara, T. Ohmi Electrochemical Society
6 Conference Proceedings Microcrystalline Si1-xGex Deposited by Magnetron Sputtering A. Hiroe, T. Goto, A. Teramoto, T. Ohmi Electrochemical Society	12 Conference Proceedings The European Space Industry in Context A. Gaubert ESA Publications Division

1

2

3

4

5

6

7

8

9

10

11

12