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The Characteristics of Hot-Carrier Stressed Bottom-Gate Polycrystalline Silicon Thin-Film Transistors Employing Alternating Magnetic-Field-Enhanced Rapid Thermal Annealing

Author(s):
Publication title:
Thin Film Transistors 9
Title of ser.:
ECS transactions
Ser. no.:
16(9)
Pub. date:
2008
Page(from):
67
Page(to):
72
Pages:
6
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
19385862
ISBN:
9781566776554 [1566776554]
Language:
English
Call no.:
E23400/16-9
Type:
Conference Proceedings

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