Blank Cover Image

Phase-shifting moiré interferometry for residual strain measurement

Author(s):
  • J. Zhou ( Beijing Institute of Technology, China )
  • Z. Liu ( Beijing Institute of Technology, China )
  • H. Xie ( Tsinghua Univ., China )
  • K. Li ( Oakland Univ., United States )
Publication title:
ICEM 2008 : International Conference on Experimental Mechanics 2008, 8-11 November 2008, Nanjing, China , editors ; Xiaoyuan He, Huimin Xie, Yilan Kang ; organized by the Chinese Society for Experimental Mechanics [and] Southeast University (China) ; sponsored by Asian Committee of Experimental Mechanics [and] the Chinese Society of Theoretical and Applied Mechanics ; cosponsored by Ministry of Education of China ... [et al.] ; cooperating organization, SPIE.
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
7375
Pub. Year:
2009
Vol.:
2
Page(from):
737546-1
Page(to):
737546-6
Pages:
6
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819476517 [081947651X]
Language:
English
Call no.:
P63600/7375
Type:
Conference Proceedings

Similar Items:

Shankar,K., Xie,H., Asundi,A.K., Oh,K.E., Chai,G.B.

SPIE-The International Society for Optical Engineering

Zhang,H., Wang,C., Liu,X., Liu,C.

SPIE-The International Society for Optical Engineering

2 Conference Proceedings Phase-shifting AFM moire method

Asundi,A.K., Xie,H., Yu,J., Zhong,Z.

SPIE-The International Society for Optical Engineering

Kim,S.-W., Choi,Y.-B., Oh,J.-T.

SPIE-The International Society for Optical Engineering

Liu, Z.W., Fang, D.N., Xie, H., Bing, Q.D., Li, S., Dai, F.

SPIE-The International Society for Optical Engineering

9 Conference Proceedings Micro/nano moire methods

Asundi, A.K., Shang, H., Xie, H., Li, B.

SPIE-The International Society for Optical Engineering

Park, J. B., Benatar, A.

Society of Plastics Engineers, Inc. (SPE)

J.M. Huntley, S.J.P. Palmer, H. Goldrein, L.G. Melin

Society of Photo-optical Instrumentation Engineers

L. Wosinski, J.-P. Bétend-Bon, B. Noharet

Society of Photo-optical Instrumentation Engineers

Xie,H., Chai,G.B., Asundi,A.K., Yu,J., Lu,Y., Ngoi,B.K.A., Zhong,Z., Kishimoto,S.

SPIE - The International Society for Optical Engineering

6 Conference Proceedings Dynamic moire interferometry

Buescher,B.J.,Jr, Bruck,H.A., Deason,V.A., Ricks,K.L., Epstein,J.S.

SPIE-The International Society for Optical Engineering

Xie, H., Liu, Z., Shang, H., Xue, Q., Jia, J., Fang, D.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12