Micro/nano scale mechanical tests based on the probe platform
- Author(s):
- Publication title:
- ICEM 2008 : International Conference on Experimental Mechanics 2008, 8-11 November 2008, Nanjing, China , editors ; Xiaoyuan He, Huimin Xie, Yilan Kang ; organized by the Chinese Society for Experimental Mechanics [and] Southeast University (China) ; sponsored by Asian Committee of Experimental Mechanics [and] the Chinese Society of Theoretical and Applied Mechanics ; cosponsored by Ministry of Education of China ... [et al.] ; cooperating organization, SPIE.
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 7375
- Pub. Year:
- 2009
- Vol.:
- 1
- Page(from):
- 73752Y-1
- Page(to):
- 73752Y-9
- Pages:
- 9
- Pub. info.:
- Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
- ISSN:
- 0277786X
- ISBN:
- 9780819476517 [081947651X]
- Language:
- English
- Call no.:
- P63600/7375
- Type:
- Conference Proceedings
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