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Quality assurance and management in microelectronics companies: ISO 9000 versus Six Sigma

Author(s):
Publication title:
Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies IV
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
7297
Pub. date:
2009
Page(from):
72972L-1
Page(to):
72972L-6
Pages:
6
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819475596 [0819475599]
Language:
English
Call no.:
P63600/7297
Type:
Conference Proceedings

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