Quality assurance and management in microelectronics companies: ISO 9000 versus Six Sigma

Quality assurance and management in microelectronics companies: ISO 9000 versus Six Sigma

Author(s):

R. Lupan ( Univ. d'Angers, France )
A. Kobi ( Univ. d'Angers, France )
C. Robledo ( Univ. d'Angers, France )
I. Bacivarov ( Politehnica Univ. of Bucharest, Romania )
A. Bacivarov ( Politehnica Univ. of Bucharest, Romania )

Publication title:

Advanced topics in optoelectronics, microelectronics, and nanotechnologies IV : 28-31 November 2008, Constanta, Romania

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

7297

Pub. Year:

2009

Page(from):

72972L-1

Page(to):

72972L-6

Pages:

6

Pub. info.:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819475596 [0819475599]

Language:

English

Call no.:

P63600/7297

Type:

Conference Proceedings

Details

TDL ID:	ZA00052808
Series ID:	PA00000029
Conf. info. (Name):	Optolectronics, Microelectronics, and Nanotechnologies
Conf. info. (Number):	2008 : 4th
Conf. info. (Venue):	Constanta, Romania
Conf. info. (Date):	2008.08.28-2008.08.31
Note for article:	Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies IV, 28-31 August 2008, Constanta, Romania - Instruments, Sensors and Microsystems, 72972L, 7297-94

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