Jitter measurements in a 1550 nm mode-locked laser

Jitter measurements in a 1550 nm mode-locked laser

Author(s):

A. Drăgulinescu ( Politehnica Univ. of Bucharest, Romania )
R. Herda ( Tampere Univ. of Technology, Finland )
M. Guină ( Tampere Univ. of Technology, Finland )

Publication title:

Advanced topics in optoelectronics, microelectronics, and nanotechnologies IV : 28-31 November 2008, Constanta, Romania

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

7297

Pub. Year:

2009

Page(from):

72970E-1

Page(to):

72970E-4

Pages:

4

Pub. info.:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819475596 [0819475599]

Language:

English

Call no.:

P63600/7297

Type:

Conference Proceedings

Details

TDL ID:	ZA00052808
Series ID:	PA00000029
Conf. info. (Name):	Optolectronics, Microelectronics, and Nanotechnologies
Conf. info. (Number):	2008 : 4th
Conf. info. (Venue):	Constanta, Romania
Conf. info. (Date):	2008.08.28-2008.08.31
Note for article:	Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies IV, 28-31 August 2008, Constanta, Romania - Advanced Materials and New Technologies, 72970E, 7297-13

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