System study and error analysis of new photoelectricity film test

Author(s):

• T. Li ( Shandong Univ. of Technology, China )
• S. Wang ( Shandong Univ. of Technology, China )
• F. Wen ( Shandong Univ. of Technology, China )
• B. Tan ( Shandong Univ. of Technology, China )

Publication title:

4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

7283

Pub. Year:

2009

Vol.:

1

Page(from):

72831S-1

Page(to):

72831S-5

Pages:

5

Pub. info.:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819475435 [0819475432]

Language:

English

Call no.:

P63600/7283

Type:

Conference Proceedings