Determination of optical constants in the VUV range for fluoride thin films

Determination of optical constants in the VUV range for fluoride thin films

Author(s):

C. Xue ( Shanghai Institute of Optics and Fine Mechanics, China )
K. Yi ( Shanghai Institute of Optics and Fine Mechanics, China )
C. Wei ( Shanghai Institute of Optics and Fine Mechanics, China )
J. Shao ( Shanghai Institute of Optics and Fine Mechanics, China )
Z. Fan ( Shanghai Institute of Optics and Fine Mechanics, China )

Publication title:

4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

7283

Pub. Year:

2009

Vol.:

1

Page(from):

72831E-1

Page(to):

72831E-8

Pages:

8

Pub. info.:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819475435 [0819475432]

Language:

English

Call no.:

P63600/7283

Type:

Conference Proceedings

Details

TDL ID:	ZA00052804
Series ID:	PA00000029
Conf. info. (Name):	International Symposium on Advanced Optical Manufacturing and Testing Technologies
Conf. info. (Number):	2008 : 4th
Conf. info. (Venue):	Chengdu, China
Conf. info. (Date):	2008.11.19-2008.11.21
Note for article:	4th International Symposium on Advanced Optical Manufacturing and Testing Technologies, 19-21 November 2008, Chengdu, China - Poster Session, 72831E, 7283-49

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