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Transformation and analysis of pixels based on low-level-light image

Author(s):
  • Y. Gao ( Nanjing Univ. of Science and Technology, China )
  • Y. Xu ( Nanyang Institute of Technology, China )
  • S. Tian ( Nanjing Univ. of Science and Technology, China )
  • B. Chang ( Nanjing Univ. of Science and Technology, China )
Publication title:
Optoelectronic measurement technology and applications : 2008 International Conference on Optical Instruments and Technology : 16-19 November 2008, Beijing, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
7160
Pub. Year:
2009
Page(from):
71602Z-1
Page(to):
71602Z-8
Pages:
8
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819474049 [0819474045]
Language:
English
Call no.:
P63600/7160
Type:
Conference Proceedings

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