Scattering performance analysis of reflectance photometer for quantifying gold labeled test strips

Scattering performance analysis of reflectance photometer for quantifying gold labeled test strips

Author(s):

L. Huang ( Shanghai Institute of Optics and Fine Mechanics, China )
Y. Zhang ( Shanghai Institute of Optics and Fine Mechanics, China )
C. Xie ( Shanghai Institute of Optics and Fine Mechanics, China )
J. Qu ( Shanghai Institute of Optics and Fine Mechanics, China )
H. Huang ( Shanghai Institute of Optics and Fine Mechanics, China )

Publication title:

2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

7156

Pub. Year:

2008

Vol.:

1

Page(from):

71561O-1

Page(to):

71561O-9

Pages:

9

Pub. info.:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819474001 [0819474002]

Language:

English

Call no.:

P63600/7156

Type:

Conference Proceedings

Details

TDL ID:	ZA00052787
Series ID:	PA00000029
Conf. info. (Name):	International Conference on Optical Instruments and Technology
Conf. info. (Number):	2008
Conf. info. (Venue):	Beijing, China
Conf. info. (Date):	2008.11.16-2008.11.19
Note for article:	2008 International Conference on Optical Instruments and Technology, 16-19 November 2008, Beijing, China - Poster Session, 71561O, 7156-46

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