A bitmap index technology adapt to original TM/ETM+ image database

A bitmap index technology adapt to original TM/ETM+ image database

Author(s):

J. Lu ( Wuhan Univ., China )
X. Chen ( Wuhan Univ., China )
B. Chen ( Wuhan Univ., China )
Y. Sun ( Wuhan Univ., China )

Publication title:

Geoinformatics 2008 and Joint Conference on GIS and Built Environment: Advanced Spatial Data Models and Analyses

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

7146

Pub. Year:

2008

Vol.:

1

Page(from):

71460O-1

Page(to):

71460O-9

Pages:

9

Pub. info.:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819473882 [081947388X]

Language:

English

Call no.:

P63600/7146

Type:

Conference Proceedings

Details

TDL ID:	ZA00052777
Series ID:	PA00000029
Conf. info. (Name):	International Conference on GeoInformatics
Conf. info. (Number):	2008 : 16th
Conf. info. (Venue):	Guangzhou, China
Conf. info. (Date):	2008.06.28-2008.06.29
Note for article:	Geoinformatics 2008 and Joint Conference on GIS and Built Environment, 28-29 June 2008, Guangzhou, China - Spatial Relations and Spatial-Temporal Databases, 71460O, 7146-23

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