Experimental proximity matching of ArF scanners
- Author(s):
- J. Bekaert ( IMEC vzw, Belgium )
- L. Van Look ( IMEC vzw, Belgium )
- P. De Bisschop ( IMEC vzw, Belgium )
- J. Van de Kerkhove ( IMEC vzw, Belgium )
- G. Vandenberghe ( IMEC vzw, Belgium )
- Publication title:
- Lithography Asia 2008
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 7140
- Pub. Year:
- 2008
- Vol.:
- 2
- Page(from):
- 714027-1
- Page(to):
- 714027-11
- Pages:
- 11
- Pub. info.:
- Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
- ISSN:
- 0277786X
- ISBN:
- 9780819473813 [0819473812]
- Language:
- English
- Call no.:
- P63600/7140
- Type:
- Conference Proceedings
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