Test method based on neural network for crosstalk faults in digital circuits

Test method based on neural network for crosstalk faults in digital circuits

Author(s):

Z. Pan ( South China Normal Univ., China )
L. Cheng ( South China Normal Univ., China )
G. Zhang ( Sun Yat-Sen Univ., China )

Publication title:

Fifth International Symposium on Instrumentation Science and Technology

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

7133

Pub. Year:

2008

Vol.:

1

Page(from):

713306-1

Page(to):

713306-7

Pages:

7

Pub. info.:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819473677 [0819473677]

Language:

English

Call no.:

P63600/7133

Type:

Conference Proceedings

Details

TDL ID:	ZA00052764
Series ID:	PA00000029
Conf. info. (Name):	International Symposium on Instrumentation Science and Technology
Conf. info. (Number):	2008 : 5th
Conf. info. (Venue):	Shenyang, China
Conf. info. (Date):	2008.09.15-2008.09.18
Note for article:	5th International Symposium on Instrumentation Science and Technology, 15-18 September 2008, Shenyang, China - Session 1. Instrument Science: Fundamental Theory and Methodology, 713306, 7133-105

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