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Symmetrically associated combination method for accuracy verification of Coordinate Measuring Machines

Author(s):
  • H. Wang ( Hefei Univ. of Technology, China )
  • X. Chen ( Hefei Univ. of Technology, China )
  • Y. Fei ( Hefei Univ. of Technology, China )
Publication title:
Fifth International Symposium on Instrumentation Science and Technology
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
7133
Pub. date:
2008
Vol.:
1
Page(from):
713305-1
Page(to):
713305-7
Pages:
7
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819473677 [0819473677]
Language:
English
Call no.:
P63600/7133
Type:
Conference Proceedings

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