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Determination of mechanical properties of ultra-thin films by nanoindentation and nanoscratch techniques

Author(s):
  • H. Wang ( Academy of Armored Forces Engineering, China )
  • P. Shi ( Academy of Armored Forces Engineering, China )
  • Z. Cai ( Academy of Armored Forces Engineering, China )
  • B. Xu ( Academy of Armored Forces Engineering, China )
Publication title:
Fourth International Symposium on Precision Mechanical Measurements
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
7130
Pub. date:
2008
Vol.:
1
Page(from):
71300M-1
Page(to):
71300M-6
Pages:
6
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819473646 [0819473642]
Language:
English
Call no.:
P63600/7130
Type:
Conference Proceedings

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