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A simple system for measuring small phase retardation of an optical thin fil

Author(s):
Publication title:
Advances in optical thin films III
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
7101
Pub. date:
2008
Page(from):
71011H-1
Page(to):
71011H-7
Pages:
7
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819473318 [0819473316]
Language:
English
Call no.:
P63600/7101
Type:
Conference Proceedings

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