Blank Cover Image

Assessing the impact of future climate change on wheat production in Huang-Huai-Hai Plain in China based on GIS and crop model

Author(s):
  • Z. Tian ( Shanghai Climate Ctr., China )
  • J. Shi ( Shanghai Climate Ctr., China )
  • Z. Gao ( Institute of Geographical Sciences and Natural Resources Research, China )
  • F. N. Tubiello ( International Institute for Applied Systems Analysis, Austria )
Publication title:
Remote sensing and modeling of ecosystems for sustainability V : 13 August 2008, San Diego, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
7083
Pub. Year:
2008
Page(from):
70830H-1
Page(to):
70830H-10
Pages:
10
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819473035 [0819473030]
Language:
English
Call no.:
P63600/7083
Type:
Conference Proceedings

Similar Items:

Z. Tian, X. Lei, Z. Gao

Society of Photo-optical Instrumentation Engineers

BROCCOLI A. J.

Springer-Verlag

Tian, Z., Wang, J., Gao, Z.

SPIE - The International Society of Optical Engineering

H. Kerdiles, Q. Dong, S. Spyratos, J. Gallego

ESA Communications

Gao, Z., Liu, J., Cao, M., Wang, Q., Gao, W., Slusser, J., Pan, X.

SPIE - The International Society of Optical Engineering

Gao, W., Gao, Z., Slusser, J.R., Pan, X., Ma, Y.

SPIE-The International Society for Optical Engineering

Legros J-P., Baldy C., Fromin N., Bellivier D.

Springer-Verlag

Sun, J., Baker, B., Bachelet, D., Daly, C., Ma. J., Liu, J.

SPIE - The International Society of Optical Engineering

Gao, Z., Gao, W., Slusser, J.R., Pan, X., Ma, Y.

SPIE-The International Society for Optical Engineering

Gao, Z., Gao, W., Slusser, J.

SPIE - The International Society of Optical Engineering

Shi, H., Liu, J., Zhuang, D., Hu, Y.

SPIE - The International Society of Optical Engineering

Shi, J., Gao, Z., Cui, L.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12