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Investigation of CdZnTe crystal defects using scanning spreading resistance microscopy

Author(s):
  • J. Liu ( Univ. of South Carolina, United States )
  • K. C. Mandal ( EIC Labs., Inc., United States )
  • G. Koley ( Univ. of South Carolina, United States )
Publication title:
Hard X-ray, gamma-ray, and neutron detector physics X : 11-13 August 2008, San Diego, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
7079
Pub. Year:
2008
Page(from):
70790C-1
Page(to):
70790C-9
Pages:
9
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819472991 [0819472999]
Language:
English
Call no.:
P63600/7079
Type:
Conference Proceedings

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