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High-density resolution in synchrotron-radiation-based attenuation-contrast microtomography

Author(s):
  • F. Beckmann ( GKSS-Research Ctr. Geesthacht, Germany )
  • J. Herzen ( GKSS-Research Ctr. Geesthacht, Germany )
  • A. Haibel ( GKSS-Research Ctr. Geesthacht, Germany )
  • B. Müller ( Univ. of Basel, Switzerland )
  • A. Schreyer ( GKSS-Research Ctr. Geesthacht, Germany )
Publication title:
Developments in X-ray tomography VI : 12-14 August 2008, San Diego, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
7078
Pub. Year:
2008
Page(from):
70781D-1
Page(to):
70781D-13
Pages:
13
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819472984 [0819472980]
Language:
English
Call no.:
P63600/7078
Type:
Conference Proceedings

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