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The study to optimize CD uniformity by reliable area CD measurement on 45nm D/R DRAM

Author(s):
  • Y. Choi ( Hynix Semiconductor, South Korea )
  • S. Oh ( Hynix Semiconductor, South Korea )
  • M. Kim ( Hynix Semiconductor, South Korea )
  • Y. Kim ( Hynix Semiconductor, South Korea )
  • C. Kim ( Hynix Semiconductor, South Korea )
Publication title:
Photomask and next-generation lithography mask technology XV
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
7028
Pub. Year:
2008
Vol.:
1
Page(from):
70281O-1
Page(to):
70281O-8
Pages:
8
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819472434 [0819472433]
Language:
English
Call no.:
P63600/7028
Type:
Conference Proceedings

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