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Effect of LaNiO3 sol concentration on the structure and dielectric properties of Pb(Zr0.53Ti0.47)O3 thin films grown on LaNiO3 coated Ti substrates

Author(s):
  • X. Yang ( Shanghai Univ., China )
  • J. Cheng ( Shanghai Univ., China )
  • S. Yu ( Shanghai Univ., China )
  • Z. Meng ( Shanghai Univ., China )
Publication title:
Sixth International Conference on Thin Film Physics and Applications
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6984
Pub. date:
2008
Page(from):
69842C-1
Page(to):
69842C-4
Pages:
4
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819471826 [0819471828]
Language:
English
Call no.:
P63600/6984
Type:
Conference Proceedings

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