Blank Cover Image

Scaling analysis of computational imaging systems

Author(s):
Publication title:
Visual information processing XVII : 18-19 March 2008, Orlando, Florida, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6978
Pub. Year:
2008
Page(from):
69780H-1
Page(to):
69780H-5
Pages:
5
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819471697 [0819471690]
Language:
English
Call no.:
P63600/6978
Type:
Conference Proceedings

Similar Items:

G. Euliss, A. Christiansen, R. Athale

Society of Photo-optical Instrumentation Engineers

Mait J. N

SPIE - The International Society of Optical Engineering

Mait, J.N., van der Gracht, J., Euliss, G.W.

SPIE-The International Society for Optical Engineering

van der Gracht, J., Euliss, G.W., Pauca, V.P.

SPIE-The International Society for Optical Engineering

R. Horstmeyer, G. W. Euliss, R. A. Athale, R. L Morrison, R. A. Stack

Society of Photo-optical Instrumentation Engineers

Testorf, M. E., Ly, C., Mait, J. N.

SPIE - The International Society of Optical Engineering

Gracht,J.van der, Euliss,G.W.

SPIE-The International Society for Optical Engineering

10 Conference Proceedings Extended depth of field imaging at 94 GHz

J. N. Mait, D. A. Wikner, M. S. Mirotznik, J. van der Gracht, G. P. Behrmann

Society of Photo-optical Instrumentation Engineers

G. Shambat, R. Athale, G. Euliss, M. Mirotznik, E. Johnson

Society of Photo-optical Instrumentation Engineers

Mait,J.N.

SPIE-The International Society for Optical Engineering

Euliss,G.W., Gracht,J.van der

SPIE - The International Society for Optical Engineering

Johnson, G. E., Silveira, P. E. X., Dowski, E.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12