Effect of nitrogen gas on the lifetime of carbon nanotube field emitters for electron-impact ionization mass spectrometry

Effect of nitrogen gas on the lifetime of carbon nanotube field emitters for electron-impact ionization mass spectrometry

Author(s):

S. A. Getty ( NASA Goddard Space Flight Ctr., USA )
R. A. Bis ( NASA Goddard Space Flight Ctr., USA )
S. Snyder ( Lehigh Univ., USA )
E. Gehrels ( NASA Goddard Space Flight Ctr., USA )
K. Ramirez ( NASA Goddard Space Flight Ctr., USA )

Publication title:

Micro (MEMS) and nanotechnologies for space, defense and security II : 18-20 April, 2008, Orlando, Florida, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6959

Pub. Year:

2008

Page(from):

695907-1

Page(to):

695907-10

Pages:

10

Pub. info.:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819471505 [081947150X]

Language:

English

Call no.:

P63600/6959

Type:

Conference Proceedings

Details

TDL ID:	ZA00052590
Series ID:	PA00000029
Conf. info. (Name):	Defense, Security, and Sensing : Micro (MEMS) and Nanotechnologies for Space, Defense, and Security
Conf. info. (Number):	2008 : 2nd
Conf. info. (Venue):	Orlando, Florida, USA
Conf. info. (Date):	2008.03.18-2008.03.20
Note for article:	Micro (MEMS) and nanotechnologies for space, defense and security II, Orlando, Florida, USA, 18-20 March 2008. Nanowires and Nanotubes, 695907, 6959-06

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