Quantitative measurement of laminar material properties and structure using time domain reflection imaging

Quantitative measurement of laminar material properties and structure using time domain reflection imaging

Author(s):

D. Zimdars ( Picometrix, Inc., USA )
J. White ( Picometrix, Inc., USA )
G. Fichter ( Picometrix, Inc., USA )
A. Chernovsky ( Picometrix, Inc., USA )
S. L. Williamson ( Picometrix, Inc., USA )

Publication title:

Terahertz for military and security applications VI : 18-19 March 2008, Orlando, Florida, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6949

Pub. Year:

2008

Page(from):

69490B-1

Page(to):

69490B-8

Pages:

8

Pub. info.:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819471406 [0819471402]

Language:

English

Call no.:

P63600/6949

Type:

Conference Proceedings

Details

TDL ID:	ZA00052580
Series ID:	PA00000029
Conf. info. (Name):	Defense, Security, and Sensing : Terahertz for Military and Security Applications
Conf. info. (Number):	2008 : 6th
Conf. info. (Venue):	Orlando, Florida, USA
Conf. info. (Date):	2008.03.18-2008.03.19
Note for article:	Terahertz for military and security applications VI, Orlando, Florida, USA, 18-19 March 2008. Session 2. THz Technology and Methodology, 69490B, 6949-10

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