Blank Cover Image

Double patterning down to k1=0.15 with bilayer resist

Author(s):
Publication title:
Optical Microlithography XXI
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6924
Pub. Year:
2008
Vol.:
1
Page(from):
69240Q-1
Page(to):
69240Q-12
Pages:
12
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819471093 [0819471097]
Language:
English
Call no.:
P63600/6924
Type:
Conference Proceedings

Similar Items:

C. Noelscher, F. Jauzion-Graverolle, T. Henkel

Society of Photo-optical Instrumentation Engineers

Kim,B.-K., Lee,S.-J., Lee,D.-Y., Lee,J.-W., Nam,J.-L.

SPIE-The International Society for Optical Engineering

C. Noelscher, T. Henkel, F. Jauzion-Graverolle, M. Hennig, N. Morgana

Society of Photo-optical Instrumentation Engineers

Lee, Jong-Gyu, Ramanujachary, K.V., Greenblatt, M.

Materials Research Society

Wang, P.J., Meyerson, B.S., Fahey, P.M., LeGoues, F., Scilla, G.J., Cotte, J.M.

Materials Research Society

U. Kramer, D. Jackisch, R. Wildfeuer, S. Fuchs, F. Jauzion-Graverolle

Society of Photo-optical Instrumentation Engineers

Shieh,J.-M., Suen,S.-C., Lin,K.-C., Chang,S.-C., Dai,B.-T., Chen,C.-F., Feng,M.-S.

SPIE-The International Society for Optical Engineering

Janzen, E., Linnarsson, M., Monemar, B., Kleverman, M.

Materials Research Society

Lo, S.C., Hsieh, L.K., Yeh, J.B., Pai, Y.-C., Tseng, W., Lin, M., Peterson, I.B.

SPIE-The International Society for Optical Engineering

Shieh,J.-M., Wei,T.C., Liu,C.H., Suen,S.-C., Dai,B.-T.

SPIE-The International Society for Optical Engineering

J.-M. Park, J.-H. Yoo, J.-Y. Hong, I. An, H.-K. Oh

Society of Photo-optical Instrumentation Engineers

Tran, N., Croguennec, L., Weill, F., Jordy, C., Biensan, P., Delmas, C.

Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12