Status of GaN HEMT performance and reliability
- Author(s):
- D. S. Green ( RF Micro Devices, Inc., USA )
- J. D. Brown ( RF Micro Devices, Inc., USA )
- R. Vetury ( RF Micro Devices, Inc., USA )
- S. Lee ( RF Micro Devices, Inc., USA )
- S. R. Gibb ( RF Micro Devices, Inc., USA )
- Publication title:
- Gallium nitride materials and devices III : 21-24 January 2008, San Jose, California, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 6894
- Pub. Year:
- 2008
- Page(from):
- 68941M-1
- Page(to):
- 68941M-8
- Pages:
- 8
- Pub. info.:
- Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
- ISSN:
- 0277786X
- ISBN:
- 9780819470690 [0819470694]
- Language:
- English
- Call no.:
- P63600/6894
- Type:
- Conference Proceedings
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