Structural defects and degradation of high-power pure-blue GaN-based laser diodes

Structural defects and degradation of high-power pure-blue GaN-based laser diodes

Author(s):

S. Tomiya ( Sony Corp., Japan )
O. Goto ( Sony Corp., Japan )
M. Ikeda ( Sony Corp., Japan )

Publication title:

Gallium nitride materials and devices III : 21-24 January 2008, San Jose, California, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6894

Pub. Year:

2008

Page(from):

68940N-1

Page(to):

68940N-6

Pages:

6

Pub. info.:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819470690 [0819470694]

Language:

English

Call no.:

P63600/6894

Type:

Conference Proceedings

Details

TDL ID:	ZA00052525
Series ID:	PA00000029
Conf. info. (Name):	Photonics West - Optoelectronic Materials and Devices : Gallium Nitride Materials and Devices
Conf. info. (Number):	2008 : 3rd
Conf. info. (Venue):	San Jose, California, USA
Conf. info. (Date):	2008.01.21-2008.01.24
Note for article:	Gallium nitride materials and devices III, 21-24 January 2008, San Jose, California, USA - Session 6. Lasers, Invited paper (68940N/6894-22)

Similar Items:

1 Conference Proceedings High power pure-blue semiconductor lasers O. Goto, S. Tomiya, Y. Hoshina, T. Tanaka, M. Ohta, Y. Ohizumi, Y. Yabuki, K. Funato, M. Ikeda SPIE - The International Society of Optical Engineering	7 Conference Proceedings Structural Study of Degraded II-VI Blue-Light Emitters Tomiya,S., Ukita,M., Okuyama,H., Nakano,K., Itoh,S., Ishibashi,A., Morita,E., Ikeda,M. Trans Tech Publications
2 Conference Proceedings Defects and degradation of nitride-based laser diodes (Invited Paper) [6133-08] Tomiya, S, Hino, T, Miyajima, T, Goto, O, Ikeda, M SPIE - The International Society of Optical Engineering	8 Conference Proceedings Degradation of GaN-based high-power lasers and recent advancements (Invited Paper) Takeya, M., Hashizu, T., Ikeda, M. SPIE - The International Society of Optical Engineering
3 Conference Proceedings Structural Defects related issues of GaN-based Laser Diodes Tomiya, Shigetaka, Takeya, Motonobu, Goto, Shu, Ikeda, Masao Materials Research Society	9 Conference Proceedings Growth and Characterization of GaN Underlying Layer Used in Blue-Violet GaN-Based Laser Diodes on Sapphire Funato, Kenji, Hino, Tomonori, Tomiya, Shigetaka, Miyajima, Takao, Asano, Takeharu, Tojyo, Tsyuyoshi, Hashimoto, … Materials Research Society
4 Conference Proceedings Structural Defects in Mg-Doped GaN and AlGaN Grown by MOCVD Tomiya, S., Goto, S., Takeya, M., Ikeda, M. Materials Research Society	10 Conference Proceedings High-power operation of inner-stripe GaN-based blue-violet laser diodes M. Ohya, K. Fukuda, I. Masumoto, S. Kohmoto, K. Naniwae, M. Yamada, M. Matsudate, T. Tsukuda, T. Akagawa, C. Sasaoka SPIE - The International Society of Optical Engineering
5 Conference Proceedings GaN-based violet-blue laser diodes Hashimoto,S., Nakajima,H., Yanashima,K., Asatsuma,T., Yamaguchi,T., Yoshida,H., Ozawa,M., Funato,K., Tomiya,S., … SPIE-The International Society for Optical Engineering	11 Conference Proceedings Degradation modes of high-power InGaN/GaN laser diodes on low-defect GaN substrates C. C. Kim, Y. Choi, Y. H. Jang, M. K. Kang, M. Joo Society of Photo-optical Instrumentation Engineers
6 Conference Proceedings Structural Defects in GaN-Based Materials and Their Relation to GaN-Based Laser Diodes Shigetaka Tomiya, Masao Ikeda, Shinji Tanaka, Yuya Kanitani, Tadakatsu Ohkubo, Kazuhiro Hono Materials Research Society	12 Conference Proceedings Over 100-mW blue-violet laser diodes for Blu-ray Disc system Asano, T., Takeya, M., Mizuno, T., Ikeda, S., Ohfuji, Y., Fujimoto, T., Oikawa, K., Goto, S., Hashizu, T., Aga, K., … SPIE - The International Society of Optical Engineering

1

2

3

4

5

6

7

8

9

10

11

12