High-power laser bars with emission in the red spectral range for medical applications
- Author(s):
- K. Boucke ( Fraunhofer Institute for Laser Technology, Germany )
- W. Schmid ( OSRAM Opto Semiconductors GmbH, Germany )
- W. Brandenburg ( Fraunhofer Institute for Laser Technology, Germany )
- M. Mueller ( OSRAM Opto Semiconductors GmbH, Germany )
- U. StrauB ( OSRAM Opto Semiconductors GmbH, Germany )
- Publication title:
- High-power diode laser technology and applications VI : 21-23 January 2008, San Jose, California, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 6876
- Pub. Year:
- 2008
- Page(from):
- 68761C-1
- Page(to):
- 68761C-12
- Pages:
- 12
- Pub. info.:
- Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
- ISSN:
- 0277786X
- ISBN:
- 9780819470515 [0819470511]
- Language:
- English
- Call no.:
- P63600/6876
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
Packaging and characterization equipment for high-power diode laser bars and VCSELs
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
2
Conference Proceedings
Expansion-matched passively cooled heatsinks with low thermal resistance for high-power diode laser bars [6104-03]
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
3
Conference Proceedings
High-power diode laser bars with 19 up to 48 individually addressable emitters
SPIE-The International Society for Optical Engineering |
9
Conference Proceedings
Numerical simulations of novel high-power high-brightness diode laser structures
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
6
Conference Proceedings
Degradation behavior and thermal properties of red (650 nm) high-power diode single emitters and laser bars
SPIE - The International Society of Optical Engineering |
SPIE - The International Society for Optical Engineering |