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A comprehensive reliability study of high-power 808 nm laser diodes mounted with AuSn and indium

Author(s):
Publication title:
High-power diode laser technology and applications VI : 21-23 January 2008, San Jose, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6876
Pub. Year:
2008
Page(from):
687618-1
Page(to):
687618-10
Pages:
10
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819470515 [0819470511]
Language:
English
Call no.:
P63600/6876
Type:
Conference Proceedings

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