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Carrier accumulation effect in PCSS

Author(s):
  • Y. Sun ( Xidian Univ., China )
  • S. Shi ( Xidian Univ., China )
  • J. Liu ( Xidian Univ., China )
Publication title:
Optoelectronic devices and integration II : 12-15 November 2007, Beijing, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6838
Pub. Year:
2008
Page(from):
683820-1
Page(to):
683820-3
Pages:
3
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819470133 [0819470139]
Language:
English
Call no.:
P63600/6838
Type:
Conference Proceedings

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